![]() ![]() SPECS GmbH (Surface Analysis, XPS, AFM-STM in UHV) MicroMaterials Ltd (Nanoindentation Systems) Sopralab (ellipsometry and thin film pororisty) Veeco Instruments (SPM, Optical and Mechanical Profilers) Some of our principals that are specifically of interest for the attendees to this conference are listed below: counts amongst its customers the principal Official Organisation Investigation Centres and private customers in the microelectronic, aerospace, automotive, optical, food and pharmaceutical industries and in innovative fields such as biotechnology and nanofabrication. Vacuum and cryogenics instrumentation and technology Surface and material characterisation and metrology In these last few years, TELSTAR INSTRUMAT has strengthened its activities representing leading companies in Spain & Portugal in the following applications: develops high technology instrumentation sales for research and industry, offering suitable technological tools adapted to each application, in order to improve the scientific researches or productive processes of our clients. The New and Powerful Combination of FIB and GEMINI® Column: QUANTUMWISE PHOTO UPGRADECombined with dedicated upgrade strategies, this will protect your investment for its entire lifetime. ![]() Our global applications and service network guarantees fast, reliable and high quality support focussed on customer requirements. ![]() Nowadays, the company’s extensive know-how also comprises ion-beam technology and e-beam based analysis technology enable us to deliver innovative solutions for your business. The history of electron microscopy at Carl Zeiss dates back to 1949 when the first commercial TEM was launched. Development and production facilities are based in Oberkochen (Germany), Peabody, MA (USA) and Cambridge (UK). The Electron Microscopy Division is an integral part of Carl Zeiss developing, producing, selling and servicing SEM, TEM and Particle Beam instruments designed to set unique high quality standards and to provide customer focused solutions for the Semiconductor, Material Analysis and Life Science application fields worldwide. QUANTUMWISE PHOTO DOWNLOADWSxM is available for its free download at If you have any questions, or want any information about Nanotec Electronica, please contact us at: Its user-friendly interface ensures easy operation of SPM microscopes and data processing. QUANTUMWISE PHOTO SOFTWARENanotec has also developed and freely distributes SPM software WSxM. Highly versatile, it allows different modes of operation from Contact Mode to Frequency Modulation Mode and lithography ensuring a reliable and accurate performance of all SPM systems. Nanotec Electronica also provides Dulcinea Control Systems, with an open and modular design that facilitates interfacing with any other standard AFM/SNOM/STM system available in the market. Its robust design provides strong mechanical stability to ensure high imaging resolution, and its semi-automated and open design allows scientists to exploit the capability of SPM to its maximum for both research and academic purposes. Nanotec´s Cervantes FullMode Atomic Force Microscope (AFM) in its several configurations allows not only imaging samples with atomic precision but also the study of magnetic, electronic and mechanical properties at the nanoscale, making it a powerful tool for physicists, chemists, biologists and engineers willing to characterize their samples at the nanometer scale. With its headquarters based in Spain and distributors located around the world, Nanotec ensures global presence and guarantees total customer satisfaction. Our highly qualified team uses cutting-edge technology in order to provide a cost-effective tool to gain access to the nanometer scale for both scientific and industrial communities. In only ten years Nanotec Electronica has established itself as one of the strongest companies that design, manufacture and supply Scanning Probe Microscopes (SPM). Nanotec Electronica is one of the leading companies in the Nanotechnology Industry. ![]()
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